Trace and Log Analysis

A Pattern Reference

for Diagnostics and

Anomaly Detection

Third Edition

Dmitry Vostokov Software Diagnostics Institute

 

 

 

 

 

 

Published by OpenTask, Republic of Ireland

Copyright © 2019 by Dmitry Vostokov

Copyright © 2019 by Software Diagnostics Institute

All rights reserved. No part of this book may be reproduced, stored in a retrieval system, or transmitted, in any form or by any means, without the prior written permission of the publisher.

OpenTask books are available through booksellers and distributors worldwide. For further information or comments, send requests to [email protected].

Product and company names mentioned in this book may be trademarks of their owners.

A CIP catalog record for this book is available from the British Library.

ISBN-13: 978-1-912636-04-4 (Paperback)

First printing, 2019

Revision 1.01 (August 2019)

 

Preface to the Third Edition

 

44 new trace and log analysis patterns have been discovered since the publication of the second edition two and a half years ago. Memory Dump Analysis Anthology has also grown to 4,300 pages with the publication of volumes 10 and 11. More ideas from contemporary mathematics were introduced to software diagnostics theory that is reflected in the added analysis patterns. This edition also includes 11 analysis patterns from the forthcoming volume 12. We also added diagrams for several old analysis pattern descriptions.

Because the scope of applicability of such patterns is much wider than just software execution artifacts, we changed the title and subtitle to “Trace and Log Analysis: A Pattern Reference for Diagnostics and Anomaly Detection.” We also included the following appendixes:

  1. the analysis pattern classification;
  2. the influence of narratology and contemporary mathematics on some pattern language names.

We also checked and corrected no longer available endnote links.

 

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