Trace and Log Analysis |
A Pattern Reference for Diagnostics and Anomaly Detection Third Edition |
Dmitry Vostokov Software Diagnostics Institute |
Published by OpenTask, Republic of Ireland
Copyright © 2019 by Dmitry Vostokov
Copyright © 2019 by Software Diagnostics Institute
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ISBN-13: 978-1-912636-04-4 (Paperback)
First printing, 2019
Revision 1.01 (August 2019)
Preface to the Third Edition
44 new trace and log analysis patterns have been discovered since the publication of the second edition two and a half years ago. Memory Dump Analysis Anthology has also grown to 4,300 pages with the publication of volumes 10 and 11. More ideas from contemporary mathematics were introduced to software diagnostics theory that is reflected in the added analysis patterns. This edition also includes 11 analysis patterns from the forthcoming volume 12. We also added diagrams for several old analysis pattern descriptions.
Because the scope of applicability of such patterns is much wider than just software execution artifacts, we changed the title and subtitle to “Trace and Log Analysis: A Pattern Reference for Diagnostics and Anomaly Detection.” We also included the following appendixes:
We also checked and corrected no longer available endnote links.