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System-on-Chip Test Architectures: Nanometer Design for Testability

Nur Touba, Charles Stroud, Laung-Terng Wang

System-on-Chip Test Architectures: Nanometer Design for Testability

Author Nur Touba , Charles Stroud , Laung-Terng Wang
Release Date 2007/11
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands ....

18.217.3.20