[X] dimension dependent on property, [‐] dimensionless property, bold italic = vector
Φ | potential energy [J] |
Γ | excess [mol m−2] |
Π | disjoining pressure [Pa] |
Ψ | electrical potential [J] |
α | constant [X] thermal expansion coefficient [K−1] polarizability [C2 m2 J−1] branching index [‐] Dundurs parameter [‐] |
β | constant [X] 1/kT [J−1] Dundurs parameter [‐] |
γ | activity coefficient [‐] interface energy [J m−2] crosslinking index [‐] |
δ | solubility parameter [MPa1/2] Dirac delta function [‐] |
ε | energy [J] permittivity [C2 N−1 m−2] strain [‐] |
θ | contact angle [°] |
η | (bulk) viscosity [Pa s] |
κ | inverse Debye length [m−1] curvature [m−1] compressibility [m2 N−1] |
λ | parameter [X] wave length [m] |
μ | dipole moment [C m] |
ν | frequency [s−1] Poisson's ratio |
π | spreading pressure [Pa] |
ρ | number density [m−3] mass density [kg m−3] radius of curvature [m] |
σ | (hard sphere) diameter [m] surface charge density [C m−2] |
τ | characteristic time [s] |
φ | (pair) potential energy [J] electrical potential [V m−1] volume fraction [‐] |
χ | Flory parameter [‐] |
ψ | electrical potential [J] |
ω | circular frequency [s−1] |
E | electric field [V m−1] |
F | force [N] |
e | unit vector [m] |
f | force [N] |
r | coordinate [m] |
u | displacement [m] |
v | velocity [m s−1] |
x | coordinate [m] |
A | area [m2] constant [X] |
B | constant [X] |
C | constant [X] characteristic ratio [‐] concentration [mol l−1] |
D | diffusivity [m2 s−1] |
Đ | dispersity [‐] |
E | energy [J] electric field [V m−1] Young's modulus [GPa] |
F | Helmholtz energy [J] force [N] |
G | Gibbs energy [J] |
H | enthalpy [J] Hamaker constant [J] |
I | intensity [X] |
J | flux [s−1 m−2] |
K | equilibrium constant [X] |
L | length [m] |
M | molar mass [g mol−1] |
N | number of particles [‐] |
NA | Avogadro's number [mol−1] |
Nα | number of particles of component α [‐] |
P | pressure [Pa] |
Q | charge [C] heat [J] |
R | gas constant [J K−1 mol−1] radius of object [m] distance between objects [m] fracture energy [J m−2] |
Rg | radius of gyration [m] |
S | entropy [J K−1] spreading coefficient [J m−2] |
T | kinetic energy [J] temperature [K] |
Tg | glass transition temperature |
U | (internal) energy [J] |
V | potential energy [J] volume [m3] |
W | work [J] |
X | degree of polymerization |
Y | yield strength |
a | capillary constant [m−1] constant [X] |
b | constant [X] |
c | constant [X] inverse spring constant [m N−1] concentration [mol l−1] |
e | unit charge [C] |
f | (volume) fraction [‐] specific Helmholtz energy [J kg−1] force [N] spring constant [N m−1] functionality [‐] |
g | specific Gibbs energy [J kg−1] |
j | flux [s−1 m−2] |
k | Boltzmann's constant [J K−1] spring constant [N−1] rate constant [X] |
l | length [m] |
m | mass [kg] |
n | material constant [X] |
nα | number of moles of component α [‐] |
q | charge [C] |
r | distance [m] rate [X] |
s | specific entropy [J K−1 kg−1] |
t | time [s] |
u | (pair) potential energy [J] |
v | volume [m3] |
w | regular solution parameter [J] potential [J] |
xi | mole fraction of component i [X] |
x | coordinate [X] |
y | coordinate [X] |
z | coordinate [X] |
zi | valency of particle i [‐] |
≡ | identical to |
≅ | approximately equal to |
≈ | very approximately equal to |
∼ | proportional to |
⇔ | corresponds with |
풪(x) | order of magnitude x |
E | excess |
∞ | infinite dilution |
° | standard |
* | pure substance |
‡ | activated complex |
id | ideal |
f | formation reaction |
fus | fusion |
mix | mixing |
m | molar |
r | reaction in general |
sol | solution |
sub | sublimation |
trs | transition |
vap | vaporization |
AC | alternative current |
AF | antifouling |
AFAM | atomic force acoustic microscopy |
AFM | atomic force microscopy |
APTES | aminopropyltriethoxysilane |
AT | associative thickener |
ATO | antimony‐doped tin oxide |
ATR | attenuated total reflection |
ATRP | atom transfer radical polymerization |
BFA | bis‐furyl‐acetone |
BOPP | biaxially oriented polypropylene |
BPA | bisphenol A |
CA | contact angle |
CAFM | conductive AFM |
CB | carbon black |
CCC | critical coagulation concentration |
CMC | critical micelle concentration |
CNT | carbon nanotube |
CP | cross‐polarization |
CPVC | critical pigment volume concentration |
CT | color temperature, charge transfer, |
conventional thickener | |
DA | Diels–Alder |
DB | degree of branching |
DBTTABLE | dibutyl tin laurate |
DC | direct current |
DCPD | dicyclopentadiene |
DIPA | diisopropanol amide |
TABLEC | diffusion‐limited coagulation |
TABLEVO | Derjaguin–Landau–Verwey–Overbeek |
DM(T)A | differential mechanical (thermal) analysis |
DMEA | dimethylaminoethanol |
DMPA | dimethylpropionic acid |
DMT | Derjaguin–Muller–Toropov |
DP | degree of polymerization |
DPD | dissipative particle dynamics |
DRCA | dynamic recovery contact angle |
DSC | differential scanning calorimetry |
EAK | elastically active knots |
EAN | elastically active chain |
ECH | epichlorohydrin |
ED | electrodeposition |
EDS | energy dispersive spectrometry |
EG | ethylene glycol |
EIS | electrical impedance spectroscopy |
EM | electron microscopy |
EMT | effective medium theory |
EO | ethylene oxide |
ESEM | environmental SEM |
FWHM | full width at half maximum |
GAE | Gibbs adsorption equation |
GC | gas chromatography |
GN | generalized Newtonian |
HAP | hazardous air pollutant |
HB | hyperbranched |
HEUR | hydrophobically endcapped urethane |
HLB | hydrophilic–lipophilic balance |
IEP | isoelectric point |
IMFP | inelastic mean free path |
IN | iodine number |
IR | infrared |
JKR | Johnson–Kendall–Roberts |
LCD | liquid crystal display |
LCST | lower critical solution temperature |
LED | light‐emitting diode |
LEFM | linear elastic fracture mechanics |
LEIS | low energy electron scattering |
lhs | left‐hand side |
MALDI | matrix‐assisted laser desorption spectrometry |
MAS | magic angle spinning |
MDSC | modulated DSC |
MEKO | methyl ethyl ketoxime |
MFFT | minimum film formation temperature |
MS | mass spectrometry |
MWD | molecular weight distribution |
NA | numerical aperture |
NMR | nuclear magnetic resonance |
O/W | oil‐in‐water |
OM | optical microscopy |
OPS | organo‐psycho syndrome |
OPV | organic photovoltaic |
P3HT | poly(3‐hexyl thiophene) |
PA | polyacetylene |
PC | polycarbonate |
PCBM | (6,6)‐phenyl‐C61‐butyric acid methyl ester |
PCL | polycaprolactam |
PDMS | poly(dimethyl siloxane) |
PE | polyethylene |
PEG | polyethylene glycol |
PEN | poly(ethylene naphthalate) |
PEO | poly(ethylene oxide) |
PET | poly(ethylene terephthalate) |
PFPE | perfluoro polyether |
PMEA | poly(methoxy ethylacrylate) |
PMMA | poly(methyl methacrylate) |
POM | polyoxymethylene |
PP | polypropylene |
PS | polystyrene |
PTFE | polytetrafluoroethylene |
PUR | polyurethane resin |
PVC | polyvinyl chloride, pigment volume concentration |
PVDF | polyvinyldifluoridene |
QDA | quantitative descriptive analysis |
RF | radio frequency |
RH | relative humidity |
rhs | right‐hand side |
ROMP | ring‐opening metathesis polymerization |
SAM | self‐assembled monolayers |
SAN | styrene‐co‐acrylonitrile |
SB | solventborne |
SCF | self‐consistent field |
SDBS | sodium dodecyl benzenesulfonate |
SDS | sodium dodecyl sulfonate |
SEC | size exclusion chromatography |
SECM | scanning electrochemical microscopy |
SEM | scanning electron microscopy |
SIMS | secondary ion mass spectrometry |
SMA | styrene maleic anhydride |
SPM | surface probe microscopy |
SRE | self‐replenishing efficiency |
SSH | Su–Schrieffer–Heeger |
STC | surface tension components |
STEM | scanning TEM |
SVET | scanning vibrating electrode technique |
TEM | transmission electron microscopy |
TEOS | tetraethyl orthosilicate |
TERS | tip‐enhanced Raman spectroscopy |
TGA | thermogravimetric analysis |
TGIC | triglycidyl isocyanurate |
TMA | trimethylamine |
TMP | trimethylol propane |
TMS | tetramethyl silane trimellitic anhydride |
TTT | temperature–time transformation |
UCST | upper critical solution temperature |
UV | ultraviolet |
VOC | volatile organic component |
vdW | van der Waals |
vOGC | van Oss–Good–Chaudhury |
W/O | water‐in‐oil |
WB | waterborne |
WDS | wave length dispersive spectrometry |
WLF | Williams–Landel–Ferry |
XPS | X‐ray photoelectron spectroscopy |
XRD | X‐ray diffraction |